The author would like to thank Dr. A. Layadi and Professor J.O. Artman for helpful discussions relating to the measured magnetic properties. VSM measurements were made at the Carnegie Mellon University Data Storage Systems Center.
Samples were produced by the author at Carnegie Mellon through a grant from the Division of Materials Research, National Science Foundation, Grant No. DMR-8613386.
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Researchers should cite this work as follows:
- electron microscopy
- magnetic domains
- magnetic thin films
- thin films