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Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films

By Brian Demczyk

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Abstract

In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.

Credits

The author would like to thank Dr. A. Layadi and Professor J.O. Artman for helpful discussions relating to the measured magnetic properties. VSM measurements were made at the Carnegie Mellon University Data Storage Systems Center.

Sponsored by

Samples were produced by the author at Carnegie Mellon through a grant from the Division of Materials Research, National Science Foundation, Grant No. DMR-8613386.

Cite this work

Researchers should cite this work as follows:

  • Brian Demczyk (2012), "Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films," http://nanohub.org/resources/13031.

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