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As research on graphene advances and graphene is grown over larger wafers, a universal metric to characterize its quality and quantity is necessary in order to promote further research and commercial applications. We present a novel computer aided Raman spectroscopy optical processing, Graphene Raman Imaging and Spectroscopy Processing. GRISP is capable of giving accurate statistical data of key features of Raman spectrum of graphene over large areas, namely 2D, G and D peak intensity and ratios as well as 2D peak Full With at Half-Maximum. GRISP also maps processed data to form images from which growth quality can be easily visualized and quantified.
Please note that the full name and updated affiliation info to the third (corresponding faculty) author hould be Professor Deji Akinwande at the University of Texas-Austin.
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