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HomeResourcesCoursesNegative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling › Supporting Docs

Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

By Souvik Mahapatra

Electrical Engineering, IIT Bombay, India

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