Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)

By Souvik Mahapatra

Electrical Engineering, IIT Bombay, India

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Cite this work

Researchers should cite this work as follows:

  • Souvik Mahapatra (2012), "Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)," http://nanohub.org/resources/13614.

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Tags

  1. CMOS
  2. CMOS device reliability
  3. Device Characterization
  4. Device Modeling
  5. MOSFET
  6. MOSFET modeling
  7. nanoelectronics
  8. Negative Bias Temperature Instability
  9. reliability