The Czerny-Turner type imaging spectrograph is by far the most commonly used
research instrument in dispersive optical spectroscopy. Image aberrations inherent in
this type spectrograph impart distortions to recorded spectra that affect resolution both
spatially and spectrally. Understanding the effect these aberrations have on spectral
data are typically left as an exercise for the researcher in subsequent post-processing
and data analysis steps.


We present the discovery of the Schmidt-Czerny-Turner spectrograph which is
shown to be free from all the offending image aberrations of its predecessor. The
three major offending image aberrations present in the traditional Czerny-Turner type
spectrograph, Spherical, Coma, and Astigmatism are discussed with respect to the
effects they have on spectral data and methods for the researcher to minimize their
severity are covered.


The scope of experiments and techniques now made possible by the Schmidt-
Czerny-Turner imaging spectrograph are discussed.

6th Advanced Materials Characterization Workshop

June 6-7, 2012

Workshop Premise

This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques

for materials characterization with emphasis on practical applications. The workshop will cover the

following techniques:

• Atomic force microscopy (AFM)
• X-ray diffraction, reflectivity and fluorescence (XRD, XRR, XRF) including high-temperature

  analysis

• Scanning and transmission electron microscopy (SEM, TEM, STEM); focused ion beam (FIB)
• Auger electron spectroscopy (AES), and x-ray photoelectron spectroscopy (XPS)
• Secondary ion mass spectrometry (SIMS), and Rutherford backscattering (RBS)
• Optical spectroscopy (Raman, Photoluminescence, FTIR, ellipsometry, etc.)
• Optical microscopy (confocal microscopy, near-field scanning optical microscopy, Raman microscopy,

  etc.)

• Nanoindentation analysis (including nano electric contact resistance, acoustic emission, and nano

  dynamical mechanical analysis).

• Biological materials: tutorial on sample prep and analysis of biological material.

Lectures will be presented by scientists with extensive academic and industrial experience in each

technique. The following topics will be covered:

• A short review of the fundamentals of each analytical technique.
• Critical review of strengths and weaknesses of each technique: how to combine techniques to extract the

  best possible complementary information.

• Comparative review of the instrumentation options with emphasis on differences in resolution,

  sensitivity, detection limits, sample requirements.

• Data acquisition strategies and data processing methods.
• Expert tips on how to avoid measurement artifacts.
• Detailed discussion of practical examples including industrial applications in areas such as

  nanotechnology, microelectronics, thin films, coatings, bioengineering, mineralogy, medical, and

  pharmaceutical research.

The workshop will also include an instrument vendors' show, where industrial scientists will introduce new

instrumentation and discuss new applications and technologies. Laboratory tours displaying the main

analytical instruments available at the MRL will be offered during this workshop.

Contacts

amcw2012@mrl.illinois.edu
Mauro Sardela, (217) 244-0547

AMC 2012 Sponsors

Researchers should cite this work as follows:

• Jason McClure; Charlie Newman; NanoBio Node (2012), "[Illinois] The Schmidt-Czerny-Turner Spectrograph," https://nanohub.org/resources/14207.

1. AMC12
2. Beckman Institute
3. material characterization
4. NanoBio Node