This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will cover the following techniques: Atomic force microscopy (AFM) X-ray diffraction, reflectivity and fluorescence (XRD, XRR, XRF) including high-temperature analysis Scanning and transmission electron microscopy (SEM, TEM, STEM); focused ion beam (FIB) Auger electron spectroscopy (AES), and x-ray photoelectron spectroscopy (XPS) Secondary ion mass spectrometry (SIMS), and Rutherford backscattering (RBS) Optical spectroscopy (Raman, Photoluminescence, FTIR, ellipsometry, etc.) Optical microscopy (confocal microscopy, near-field scanning optical microscopy, Raman microscopy, etc.) Nanoindentation analysis (including nano electric contact resistance, acoustic emission, and nano dynamical mechanical analysis). Biological materials: tutorial on sample prep and analysis of biological material.
Dr. Sardela holds a Ph.D. in Materials Science and Technology (Linkoping University, Sweden, 1994) with emphasis in x-ray scattering and characterization of semiconductor materials. He worked four years in industrial analytical laboratories in the Silicon Valley, California. Over the past 10 years, Dr. Sardela has been a Senior Research Scientist and manager of the x-ray analytical facilities at the Frederick Seitz Materials Research Laboratory at the University of Illinois at Urbana-Champaign.
Cite this work
Researchers should cite this work as follows:
Engineering Sciences Building, University of Illinois at Urbana-Champaign, Urbana, IL