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[Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 4: X-ray Diffraction and Reflectometry

By Mauro Sardela

Senior Research Scientist, University of Illinois at Urbana-Champaign, Urbana, IL

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This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will cover the following techniques: Atomic force microscopy (AFM) X-ray diffraction, reflectivity and fluorescence (XRD, XRR, XRF) including high-temperature analysis Scanning and transmission electron microscopy (SEM, TEM, STEM); focused ion beam (FIB) Auger electron spectroscopy (AES), and x-ray photoelectron spectroscopy (XPS) Secondary ion mass spectrometry (SIMS), and Rutherford backscattering (RBS) Optical spectroscopy (Raman, Photoluminescence, FTIR, ellipsometry, etc.) Optical microscopy (confocal microscopy, near-field scanning optical microscopy, Raman microscopy, etc.) Nanoindentation analysis (including nano electric contact resistance, acoustic emission, and nano dynamical mechanical analysis). Biological materials: tutorial on sample prep and analysis of biological material.


Dr. Sardela holds a Ph.D. in Materials Science and Technology (Linkoping University, Sweden, 1994) with emphasis in x-ray scattering and characterization of semiconductor materials. He worked four years in industrial analytical laboratories in the Silicon Valley, California. Over the past 10 years, Dr. Sardela has been a Senior Research Scientist and manager of the x-ray analytical facilities at the Frederick Seitz Materials Research Laboratory at the University of Illinois at Urbana-Champaign.

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  • Mauro Sardela (2012), "[Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 4: X-ray Diffraction and Reflectometry ,"

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