NCN@Illinois Video Team
This resource belongs to the NCN@Illinois Video Team group.
This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will cover the following techniques:
Atomic force microscopy (AFM)
X-ray diffraction, reflectivity and fluorescence (XRD, XRR, XRF) including high-temperature analysis
Scanning and transmission electron microscopy (SEM, TEM, STEM); focused ion beam (FIB)
Auger electron spectroscopy (AES), and x-ray photoelectron spectroscopy (XPS)
Secondary ion mass spectrometry (SIMS), and Rutherford backscattering (RBS)
Optical spectroscopy (Raman, Photoluminescence, FTIR, ellipsometry, etc.)
Optical microscopy (confocal microscopy, near-field scanning optical microscopy, Raman microscopy, etc.)
Nanoindentation analysis (including nano electric contact resistance, acoustic emission, and nano dynamical mechanical analysis).
Biological materials: tutorial on sample prep and analysis of biological material.
University of Illinois at Urbana-Champaign
Dr. Rick Haasch is a Senior Research Scientist at the Frederick Seitz Materials Research Laboratory at the University of Illinois and Group Leader of the Surface Analysis section which includes two SIMS instruments, two MeV ion accelerators, two XPS instruments and a scanning Auger system.
Researchers should cite this work as follows:
Rick Haasch (2012), "[Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 3: X-ray Electron Spectroscopy / Auger Electron Spectroscopy," http://nanohub.org/resources/14470.
Engineering Sciences Building, University of Illinois at Urbana-Champaign, Urbana, IL