NCN@Illinois Video Team
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Integration of AFM with Raman spectrometers has made it possible to perform highly localized Raman measurements with spatial resolution far below the diffraction limit of light, thus enabling the realization of the ultimate dream of analytical chemists: spatial and spectroscopic characterization of single molecules.
AIST-NT Inc. has developed a new, advanced AFM designed specifically for integration with optical spectroscopy and providing an unprecedented combination of performance and automation. The SmartSPM enables routine acquisition of images with true molecular resolution as well as providing convenient tools for realization of the Tip Enhanced Raman Scattering (TERS) experiments.
Results of molecular resolution imaging of self-assembled layers of functional alkanes and other molecules in ambient conditions will be presented along with the data on the sub-diffraction-limit Raman imaging of carbon nano-tubes, vanadium oxide nanorods and porous silicon.
University of Illinois at Urbana-Champaign
Alexey Temiryazev-Advanced Integrative Scanning Tools for Nano-Technology
Researchers should cite this work as follows:
Alexey Temiryazev (2012), "[Illinois] Advanced Materials Characterization Workshop 2012: Advanced AFM-Raman Setup - Towards The Spatial and Spectroscopic Resolution At Single Molecule Level," https://nanohub.org/resources/14471.
Engineering Sciences Building, University of Illinois at Urbana-Champaign, Urbana, IL