On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by transmission electron microscopy and atomic force microscopy.
Recording media were fabricated and atomic force microscopy performed at the Maxtor San Jose, CA facility (now closed). Transmission electron microscopy was carried at at the National Center for Electron Microscopy at the Lawrence Berkeley national Laboratory, Berkeley, CA.
Researchers should cite this work as follows:
Brian Demczyk (2012), "On the Origin of the Orientation Ratio in Sputtered Longitudinal Media ," http://nanohub.org/resources/15606.