Modeling Interface-defect Generation (MIG)

Analyzes device reliability based on NBTI

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Version 2.1 - published on 22 Jan 2014

doi:10.4231/D3FQ9Q555 cite this

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1089 Can this software be used for PBTI simulations?
Asked by nurul azimah ahmad arzaai Open 1
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399 inconsistent exponent
Asked by Ming-Yi Lee Closed 1
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