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ECE 695A Lecture 6: Defects in the Bulk and at Interfaces

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Abstract

Outline:
  • Strain in materials/origin of defects
  • Examples: bulk defects
  • Examples: interface defects
  • Measurements
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2013), "ECE 695A Lecture 6: Defects in the Bulk and at Interfaces ," https://nanohub.org/resources/16608.

Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. bulk
  2. course lecture
  3. defects
  4. nanoelectronics
  5. nanotransistors
  6. reliability
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