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ECE 695A Lecture 7: Trapping in Pre-existing Traps

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Abstract

Outline:

  • Pre-existing vs. stress-induced traps
  • Voltage-shift in pre-existing bulk/interface traps
  • Random Telegraph Noise, 1/f noise
  • Conclusion

Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2013), "ECE 695A Lecture 7: Trapping in Pre-existing Traps," https://nanohub.org/resources/16609.

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. nanoelectronics
  3. nanotransistors
  4. random telegraph noise
  5. reliability

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