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- Pre-existing vs. stress-induced traps
- Voltage-shift in pre-existing bulk/interface traps
- Random Telegraph Noise, 1/f noise
Researchers should cite this work as follows:
Muhammad Alam (2013), "ECE 695A Lecture 7: Trapping in Pre-existing Traps," https://nanohub.org/resources/16609.
EE 226, Purdue University, West Lafayette, IN
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