ECE 695A Lecture 7: Trapping in Pre-existing Traps

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Pre-existing vs. stress-induced traps
  • Voltage-shift in pre-existing bulk/interface traps
  • Random Telegraph Noise, 1/f noise
  • Conclusion

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 7: Trapping in Pre-existing Traps," http://nanohub.org/resources/16609.

    BibTex | EndNote

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. reliability
  3. nanoelectronics
  4. nanotransistors
  5. random telegraph noise
ECE 695A Lecture 7: Trapping in Pre-existing Traps
  • Lecture 7: Trapping in Pre-existing Traps 1. Lecture 7: Trapping in Pre-exi… 0
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  • Copyright 2013 2. Copyright 2013 175.10844177510845
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  • Outline 3. Outline 176.17617617617617
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  • Four Elements of Physical Reliability 4. Four Elements of Physical Reli… 265.86586586586589
    00:00/00:00
  • Time-dependent trapping in pre-existing traps 5. Time-dependent trapping in pre… 378.24491157824491
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  • Trapping in pre-existing vs. newly created defects 6. Trapping in pre-existing vs. n… 725.89255922589257
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  • Trapping and defect generation …. 7. Trapping and defect generation… 886.45311978645316
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  • Outline 8. Outline 1002.6026026026026
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  • Recall: Carrier capture by a trap 9. Recall: Carrier capture by a t… 1008.5752419085753
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  • Fluxes into pre-existing traps and Transmission Coefficients 10. Fluxes into pre-existing traps… 1266.7000333667002
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  • Voltage-shift due to pre-existing traps in thin oxides 11. Voltage-shift due to pre-exist… 1680.8141474808142
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  • Detrapping of filled traps 12. Detrapping of filled traps 1880.08008008008
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  • Material dependence of bulk trapping 13. Material dependence of bulk tr… 2007.0737404070737
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  • Thickness dependence of bulk trapping 14. Thickness dependence of bulk t… 2149.7497497497498
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  • Trapping in thick oxides 15. Trapping in thick oxides 2197.4974974974975
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  • Trapping in thick oxides 16. Trapping in thick oxides 2312.545879212546
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  • Reflection of trapping … 17. Reflection of trapping … 2432.2322322322325
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  • Numerical validation of the results 18. Numerical validation of the re… 2528.2282282282285
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  • Trapping in interface defects 19. Trapping in interface defects 2638.1047714381048
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  • Nature of donor and acceptor traps 20. Nature of donor and acceptor t… 2675.4421087754422
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  • Donor like interface states 21. Donor like interface states 2732.2655989322657
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  • Outline 22. Outline 2798.5652318985653
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  • Four Elements of Physical Reliability 23. Four Elements of Physical Reli… 2808.0747414080747
    00:00/00:00
  • Statistics of trapping 24. Statistics of trapping 2829.5628962295632
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  • Conclusion 25. Conclusion 2983.9506172839506
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