ECE 695A Lecture 7: Trapping in Pre-existing Traps

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Pre-existing vs. stress-induced traps
  • Voltage-shift in pre-existing bulk/interface traps
  • Random Telegraph Noise, 1/f noise
  • Conclusion

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 7: Trapping in Pre-existing Traps," http://nanohub.org/resources/16609.

    BibTex | EndNote

Location

EE 226, Purdue University, West Lafayette, IN

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