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- What is the distinction between BTI and NBTI phenomena?
- What does it mean that a process is thermally activated?
- What is the difference between parametric failure and catastrophic failure? Give examples.
- What are the time-characteristics of trapping, BTI, and NBTI?
- Which device will have poorer NBTI characteristics: buried channel PFET or surface channel PFET?
- Under what condition can NBTI occur for NMOS?
- Cite two experiments to support the assertion that NBTI is a interface-related reliability issue?
Researchers should cite this work as follows:
Muhammad Alam (2013), "ECE 695A Lecture 8R: Review Questions," https://nanohub.org/resources/16666.
EE 226, Purdue University, West Lafayette, IN