ECE 695A Lecture 9: NBTI Time Dependence -- Stress Phase

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Background: Time-dependent degradation
  • The Reaction-Diffusion model
  • Approximate solution to R-D model in stress phase
  • Degradation free transistors
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 9: NBTI Time Dependence -- Stress Phase," http://nanohub.org/resources/16667.

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Location

EE 226, Purdue University, West Lafayette, IN

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