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ECE 695A Lecture 12R: Review Questions

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Abstract

Review Questions:

  1. Explain the difference between local field and global field within an oxide.
  2. Explain physically why electric field decreases bond strength.
  3. How does the dissociation process becomes non-Arrhenius?
  4. Do you think the diffusion and repassivation will also become non-Arrhenius when field is applied? Why or why not?
  5. Would field acceleration become smaller or larger for high-k dielectric for the same level of inversion charge?
  6. Is NBTI a field-driven or voltage-driven phenomenon?
  7. Can NBTI be described by classical voltage-independent voltage acceleration factors?

Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2013), "ECE 695A Lecture 12R: Review Questions," https://nanohub.org/resources/16790.

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Location

EE 226, Purdue University, West Lafayette, IN

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