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- Background and features of HCI Degradation
- Phenomenological observations
- Origin of Hot carriers
- Theory of Si-H Bond Dissociation
- Theory of Si-O Bond Dissociation
Researchers should cite this work as follows:
Muhammad A. Alam (2013), "ECE 695A Lecture 13: Introductory Lecture on HCI Degradation," https://nanohub.org/resources/16887.
EE 226, Purdue University, West Lafayette, IN