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ECE 695A Lecture 13: Introductory Lecture on HCI Degradation

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Online Presentations

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Abstract

Outline:

  • Background and features of HCI Degradation
    • Phenomenological observations
    • Origin of Hot carriers
  • Theory of Si-H Bond Dissociation
  • Theory of Si-O Bond Dissociation
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2013), "ECE 695A Lecture 13: Introductory Lecture on HCI Degradation," https://nanohub.org/resources/16887.

Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. HCI
  3. nanoelectronics
  4. nanotransistors
  5. reliability
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