- Background and features of HCI Degradation
- Phenomenological observations
- Origin of Hot carriers
- Theory of Si-H Bond Dissociation
- Theory of Si-O Bond Dissociation
Researchers should cite this work as follows:
Muhammad Alam (2013), "ECE 695A Lecture 13: Introductory Lecture on HCI Degradation," http://nanohub.org/resources/16887.
EE 226, Purdue University, West Lafayette, IN