ECE 695A Lecture 14b: Voltage Dependent HCI II

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Background and Empirical Observations
  • Theory of Hot Carriers: Hydrodynamic Model
  • Theory of Hot Carriers: Monte Carlo Model
  • Theory of Hot Carriers: Universal Scaling
  • Conclusion
  • Appendices

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 14b: Voltage Dependent HCI II," http://nanohub.org/resources/16896.

    BibTex | EndNote

Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. reliability
  3. nanoelectronics
  4. nanotransistors
  5. HCI
  6. Monte Carlo
ECE 695A Lecture 14b: Voltage Dependent HCI II
  • ECE 695 : Reliability Physics of Nano-Transistors Lecture 14B: Voltage dependent HCI 1. ECE 695 : Reliability Physics … 0
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  • copyright 2013 2. copyright 2013 9.70970970970971
    00:00/00:00
  • Substrate vs. gate current 3. Substrate vs. gate current 10.243576910243577
    00:00/00:00
  • Voltage Scaling by Substrate Current 4. Voltage Scaling by Substrate C… 178.54521187854522
    00:00/00:00
  • Isub-VD Correlation 5. Isub-VD Correlation 428.36169502836174
    00:00/00:00
  • Outline 6. Outline 541.97530864197529
    00:00/00:00
  • V- dependence at low-voltages: Monte Carlo 7. V- dependence at low-voltages:… 576.81014347681014
    00:00/00:00
  • What is the problem? 8. What is the problem? 612.54587921254586
    00:00/00:00
  • HCI by Monte Carlo Simulation 9. HCI by Monte Carlo Simulation 955.8224891558225
    00:00/00:00
  • Monte Carlo Simulation in a MOSFET 10. Monte Carlo Simulation in a MO… 1221.1211211211212
    00:00/00:00
  • Device/Monte-Carlo Simulation 11. Device/Monte-Carlo Simulation 1405.9726393059727
    00:00/00:00
  • NIT correlation with hot holes 12. NIT correlation with hot holes 1490.2235568902236
    00:00/00:00
  • Outline 13. Outline 1579.3793793793795
    00:00/00:00
  • Recall: Voltage Dependent Constant t0 14. Recall: Voltage Dependent Cons… 1585.4854854854855
    00:00/00:00
  • Universality of Degradation (NMOS) 15. Universality of Degradation (N… 1744.477811144478
    00:00/00:00
  • Universality of degradation (PMOS) 16. Universality of degradation (P… 1846.8802135468802
    00:00/00:00
  • Discussion: Voltage Acceleration 17. Discussion: Voltage Accelerati… 1994.6946946946948
    00:00/00:00
  • Conclusions 18. Conclusions 2083.0830830830832
    00:00/00:00
  • References 19. References 2177.0437103770437
    00:00/00:00