ECE 695A Lecture 15: Off-state HCI Degradation
Category
Published on
Abstract
Outline:
- ON vs. OFF State HCI Degradation
- Origin of hot carriers at off-state
- SiH vs. SiO – who is getting broken? Voltage acceleration factors by scaling
- Conclusions
Cite this work
Researchers should cite this work as follows:
-
Muhammad A. Alam (2013), "ECE 695A Lecture 15: Off-state HCI Degradation," https://nanohub.org/resources/16919.
Time
Location
EE 226, Purdue University, West Lafayette, IN