- Empirical observations regarding HCI
- Theory of bond dissociation: MVE vs. RRK
- Hot carrier dissociation of SiH bonds
- Hot carrier dissociation of SiO bonds
Researchers should cite this work as follows:
Muhammad Alam (2013), "ECE 695A Lecture 16: Temperature Dependence of HCI," https://nanohub.org/resources/16920.
EE 226, Purdue University, West Lafayette, IN