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ECE 695A Lecture 16: Temperature Dependence of HCI

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Abstract

Outline:

  • Empirical observations regarding HCI
  • Theory of bond dissociation: MVE vs. RRK
  • Hot carrier dissociation of SiH bonds
  • Hot carrier dissociation of SiO bonds
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2013), "ECE 695A Lecture 16: Temperature Dependence of HCI," https://nanohub.org/resources/16920.

Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. HCI
  3. nanoelectronics
  4. nanotransistors
  5. reliability
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