ECE 695A Lecture 18: DC-IV and Charge Pumping Methods

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Recall: Properties of Interface Defects
  • Flux-based method 1: Direct Current-Voltage method
  • Flux-based method 2: Charge pumping method
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 18: DC-IV and Charge Pumping Methods," http://nanohub.org/resources/17023.

    BibTex | EndNote

Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. reliability
  3. nanoelectronics
  4. nanotransistors
  5. defects
  6. charge pumping