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- Recall: Properties of Interface Defects
- Flux-based method 1: Direct Current-Voltage method
- Flux-based method 2: Charge pumping method
Researchers should cite this work as follows:
Muhammad A. Alam (2013), "ECE 695A Lecture 18: DC-IV and Charge Pumping Methods," https://nanohub.org/resources/17023.
EE 226, Purdue University, West Lafayette, IN
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