ECE 695A Lecture 19: Spin-Dependent Recombination and Electrically Detected Magnetic Resonance

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Importance of measuring interface damage
  • Electronic Spin Resonance ( A quick review)
  • Spin Dependent Recombination
  • Electrically detected spin-resonance and noise- spectroscopy
  • Comparing the approaches
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 19: Spin-Dependent Recombination and Electrically Detected Magnetic Resonance," http://nanohub.org/resources/17024.

    BibTex | EndNote

Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags