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- Importance of measuring interface damage
- Electronic Spin Resonance ( A quick review)
- Spin Dependent Recombination
- Electrically detected spin-resonance and noise- spectroscopy
- Comparing the approaches
Researchers should cite this work as follows:
Muhammad Alam (2013), "ECE 695A Lecture 19: Spin-Dependent Recombination and Electrically Detected Magnetic Resonance," https://nanohub.org/resources/17024.
EE 226, Purdue University, West Lafayette, IN