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ECE 695A Lecture 21: Introduction to Dielectric Breakdown

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Abstract

Outline:

  • Basic features of gate dielectric breakdown
  • Physical characterization of breakdown spot
  • Time-dependent defect generation
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad A. Alam (2013), "ECE 695A Lecture 21: Introduction to Dielectric Breakdown," https://nanohub.org/resources/17027.

Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. Dielectric Breakdown
  3. nanoelectronics
  4. reliability
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