ECE 695A Lecture 21: Introduction to Dielectric Breakdown

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Basic features of gate dielectric breakdown
  • Physical characterization of breakdown spot
  • Time-dependent defect generation
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 21: Introduction to Dielectric Breakdown," http://nanohub.org/resources/17027.

    BibTex | EndNote

Time

Location

EE 226, Purdue University, West Lafayette, IN

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