Support

Support Options

Submit a Support Ticket

 
HomeResourcesOnline PresentationsInvestigation of the Electrical Characteristics of Triple-Gate FinFETs and Silicon-Nanowire FETs › Supporting Docs

Investigation of the Electrical Characteristics of Triple-Gate FinFETs and Silicon-Nanowire FETs

By Monica Taba1, Gerhard Klimeck2

1. University of Texas at El Paso 2. Purdue University

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies.