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ECE 695A Lecture 18R: Review Questions

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Review Questions:

  1. Between DCIV and CP methods, which one is easier and why?
  2. In what ways are CP and DCIV methods better at characterizing traps compared to C-V methods?
  3. What are the problems of using CP, DCIV, C-V methods for NBTI measurements?
  4. Which method does not suffer from the same problem as CP, DCIV, etc. for NBTI and HCI applications?
  5. What method would you use to determine the density of midgap states?
  6. CP frequency has to be kept relatively high to probe interface traps; can you explain why?
  7. Why can you not use classical CP for SOI devices?

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 18R: Review Questions," http://nanohub.org/resources/17159.

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Time

Location

EE 226, Purdue University, West Lafayette, IN

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