- What is the name of the failure distribution that we expect for thin oxides?
- For thin oxides, is PMOS or NMOS more of a concern in modern transistors?
- What is DBIE? When does it occur? Can the transistor be still functional ?
- In what ways is TDDB compare with NBTI and HCI time-degradation? Explain.
- Why do you suspect that hard breakdown destroys thick oxide, while in thin oxides breakdown can be soft?
- What is stress-induced leakage current? What is ‘stress-induced’ about it?
Researchers should cite this work as follows:
EE 226, Purdue University, West Lafayette, IN
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