ECE 695A Lecture 24: Statistics of Oxide Breakdown - Cell percolation model

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Observations: Failure times are statistically distributed
  • Models of Failure Distribution: Extrinsic vs. percolation
  • Percolation theory of multiple Breakdown
  • TDDB lifetime projection
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 24: Statistics of Oxide Breakdown - Cell percolation model," http://nanohub.org/resources/17293.

    BibTex | EndNote

Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

ECE 695A Lecture 24: Statistics of Oxide Breakdown - Cell percolation model
  • Lecture 24: Statistics of Oxide Breakdown: Cell percolation model 1. Lecture 24: Statistics of Oxid… 0
    00:00/00:00
  • copyright 2013 2. copyright 2013 155.48882215548883
    00:00/00:00
  • Outline 3. Outline 156.1227894561228
    00:00/00:00
  • A Fantastic Statistical Problem 4. A Fantastic Statistical Proble… 239.73973973973975
    00:00/00:00
  • Average Failure Time vs. Failure Time Distribution 5. Average Failure Time vs. Failu… 372.60593927260595
    00:00/00:00
  • Background: Distribution shape independent of stress and area 6. Background: Distribution shape… 603.60360360360357
    00:00/00:00
  • Background: Weibull slope scales linearly with oxide thickness 7. Background: Weibull slope scal… 764.89823156489831
    00:00/00:00
  • Background: Shape of Failure distribution for HCI vs. TDDB 8. Background: Shape of Failure d… 957.05705705705714
    00:00/00:00
  • Outline 9. Outline 1069.5362028695363
    00:00/00:00
  • Intrinsic Percolation Model 10. Intrinsic Percolation Model 1159.9933266599933
    00:00/00:00
  • Comparison with Expt. 11. Comparison with Expt. 1506.7734401067735
    00:00/00:00
  • Bottom-up Prediction for Oxide Scaling 12. Bottom-up Prediction for Oxide… 1658.124791458125
    00:00/00:00
  • Homework: Derive the Projection Rules… 13. Homework: Derive the Projectio… 2104.7714381047717
    00:00/00:00
  • Lifetime projection 14. Lifetime projection 2281.3480146813481
    00:00/00:00
  • NMOS vs. PMOS Reliability 15. NMOS vs. PMOS Reliability 2381.2479145812481
    00:00/00:00
  • Outline 16. Outline 2443.7437437437438
    00:00/00:00
  • Soft breakdown for PMOS 17. Soft breakdown for PMOS 2445.578912245579
    00:00/00:00
  • Correlated vs. uncorrelated breakdown 18. Correlated vs. uncorrelated br… 2601.9686353019688
    00:00/00:00
  • Physical reasons for improved reliability 19. Physical reasons for improved … 2660.2602602602606
    00:00/00:00
  • Statistics of multiple breakdown 20. Statistics of multiple breakdo… 2723.9239239239241
    00:00/00:00
  • Statistics of Soft Breakdown 21. Statistics of Soft Breakdown 3106.8735402068737
    00:00/00:00
  • Lifetime improvement due to n-SBD 22. Lifetime improvement due to n-… 3195.6289622956292
    00:00/00:00
  • Temporal Correlation: Times to n-SBD 23. Temporal Correlation: Times to… 3309.4094094094094
    00:00/00:00
  • Temporal Independence Confirmed 24. Temporal Independence Confirme… 3359.5929262595932
    00:00/00:00
  • Outline 25. Outline 3384.1174507841174
    00:00/00:00
  • Lifetime Improvement 26. Lifetime Improvement 3406.5065065065064
    00:00/00:00
  • SBD improves Lifetime Geometrically 27. SBD improves Lifetime Geometri… 3548.5819152485819
    00:00/00:00
  • Uncorrelated Breakdown & TDDB Lifetime 28. Uncorrelated Breakdown & TDDB … 3653.2532532532532
    00:00/00:00
  • PMOS Reliability with SBD 29. PMOS Reliability with SBD 3797.4307640974307
    00:00/00:00
  • Physical Reasons for Improved Reliability 30. Physical Reasons for Improved … 3880.2469135802471
    00:00/00:00
  • Conclusions 31. Conclusions 3917.9179179179182
    00:00/00:00
  • References 32. References 4014.3143143143143
    00:00/00:00