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ECE 695A Lecture 26-1: Statistics of Soft Breakdown via Methods of Markov Chains

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:
  • Spatial vs. Temporal correlation
  • Theory of correlated Dielectric Breakdown
  • Excess leakage as a signature of correlated BD
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 26-1: Statistics of Soft Breakdown via Methods of Markov Chains," http://nanohub.org/resources/17418.

    BibTex | EndNote

Time

Location

EE 226, Purdue University, West Lafayette, IN

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