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ECE 695A Lecture 28: Circuit Implications of Dielectric Breakdown

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on



  • Part 1 - Understanding Post-BD FET behavior
    1. BD position determination
    2. Hard and Soft BD in FETs
    3. Distinguishing leakage and intrinsic FET parameters shifts
  • Part 2 - Impact of breakdown on digital circuit operation
    1. BD in ring oscillator
    2. BD in SR AM cell
    3. Timing, BD into soft node


Based on a IRPS Tutorial by Ben Kaczer

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 28: Circuit Implications of Dielectric Breakdown," http://nanohub.org/resources/17482.

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EE 226, Purdue University, West Lafayette, IN


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