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[Illinois] 6th Advanced Materials Characterization (AMC) Workshop 2012

By NanoBio Node

University of Illinois at Urbana-Champaign

Category

Workshops

Published on

Abstract


AMC 2012: 6th Advanced Materials Characterization Workshop

This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will cover the following techniques:

  • Atomic force microscopy (AFM).
  • X-ray diffraction, reflectivity and fluorescence (XRD, XRR, XRF) including high-temperature analysis.
  • Scanning and transmission electron microscopy (SEM, TEM, STEM); focused ion beam (FIB).
  • Auger electron spectroscopy (AES), and x-ray photoelectron spectroscopy (XPS).
  • Secondary ion mass spectrometry (SIMS), and Rutherford backscattering (RBS).
  • Optical spectroscopy (Raman, Photoluminescence, FTIR, ellipsometry, etc.).
  • Optical microscopy (confocal microscopy, near-field scanning optical microscopy, Raman microscopy, etc.).
  • Nanoindentation analysis (including nano electric contact resistance, acoustic emission, and nano dynamical mechanical analysis)..
  • Biological materials: tutorial on sample prep and analysis of biological material.

Lectures will be presented by scientists with extensive academic and industrial experience in each technique. The following topics will be covered:

  • A short review of the fundamentals of each analytical technique.
  • Critical review of strengths and weaknesses of each technique: how to combine techniques to extract the best possible complementary information.
  • >

  • Comparative review of the instrumentation options with emphasis on differences in resolution, sensitivity, detection limits, sample requirements.
  • Data acquisition strategies and data processing methods..
  • Expert tips on how to avoid measurement artifacts.
  • Detailed discussion of practical examples including industrial applications in areas such as nanotechnology, microelectronics, thin films, coatings, bioengineering, mineralogy, medical, and pharmaceutical research.

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Cite this work

Researchers should cite this work as follows:

  • NanoBio Node (2013), "[Illinois] 6th Advanced Materials Characterization (AMC) Workshop 2012," http://nanohub.org/resources/18203.

    BibTex | EndNote

Time

Location

Engineering Sciences Building, University of Illinois at Urbana-Champaign, Urbana, IL

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In This Workshop

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