This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.
Hard disk media were produced and atomic force microscopy performed at the Maxtor Corporation San Jose, CA facility (now closed). High-resolution transmission electron microscopy was undertaken at the National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA.
Cite this work
Researchers should cite this work as follows:
- atomic force microscopy
- transmission electron microscopy
- surface roughness scattering
- magnetic thin film media
- orientation ratio