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You are here: Resources › Online Presentations › On the Reliability of Micro-Electronic Devices: … › Reviews
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Total: updated 01 Jan, 2010
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Avg. Review: 5.0 out of 5 stars
Citations: 1

2 review(s) (Review this)

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On the Reliability of Micro-Electronic Devices: An Introductory Lecture on Negative Bias Temperature Instability

By Muhammad Alam

Purdue University, West Lafayette

In 1930s Bell Labs scientists chose to focus on Siand Ge, rather than better known semiconductors like Ag2S and Cu2S, mostly because of their reliable performance. Their choice was rewarded with the invention of bipolar transistors several years …

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  1. 5.0 out of 5 stars
    15 Oct 2006
    12:58 AM

    Anonymous said:

      0     0   PLG_RESOURCES_REVIEWS_LOGIN_TO_VOTE Awesome summary on NBTI

    Report abuse | Reply to Anonymous

  2. 5.0 out of 5 stars
    23 Nov 2005
    05:08 PM

    joey tun said:

      0     0   PLG_RESOURCES_REVIEWS_LOGIN_TO_VOTE one of the clearest and simple explanations on NBTI

    Report abuse | Reply to joey tun

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