Support

Support Options

Submit a Support Ticket

 
You are here: HomeResourcesOnline PresentationsOn the Reliability of Micro-Electronic Devices: An Introductory Lecture on Negative Bias Temperature InstabilityReviews

On the Reliability of Micro-Electronic Devices: An Introductory Lecture on Negative Bias Temperature Instability

By Muhammad Alam

Purdue University

View Presentation (SWF)

Licensed under Creative Commons according to this deed.

Write a review Reviews

  1. 5.0 out of 5 stars

    Angel Brucena

      0     0   Please login to vote.

    I think, this subject is very important, because that NBTI mechanism could permit to get the macroscopic mechanisms like, threshold Voltage, … and that it is very important to use to forsee the failures in electronic components, in sectors, like trains, cars, … Thank you verfy much for these pedagogical supports. Angel

    Report abuse | Reply

  2. 5.0 out of 5 stars

    Anonymous

      0     0   Please login to vote.

    Awesome summary on NBTI

    Report abuse | Reply

  3. 5.0 out of 5 stars

    joey tun

      0     0   Please login to vote.

    one of the clearest and simple explanations on NBTI

    Report abuse | Reply

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies.