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Home › Resources › Online Presentations › On the Reliability of Micro-Electronic Devices: An Introductory Lecture on Negative Bias Temperature Instability › Supporting Docs

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On the Reliability of Micro-Electronic Devices: An Introductory Lecture on Negative Bias Temperature Instability

By Muhammad Alam

Purdue University

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Lecture 10: Interface Damage & Negative Bias Temperature Instability

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(PDF, 2.79 Mb) Presentation Slides

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