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Frontiers in Scanning Probe Microscopy

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From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world.

The three day workshop featured thematically arranged invited talks. The workshop themes are broadly divided into (a) Dynamic AFM methods, (b) Dynamic AFM applications and (c) Nanomechanics. Within these themes, the invited talks covered a diverse array of topics including atomic and sub-atomic resolution imaging, scanning under liquids, dynamic AFM applications in biology, dynamic system approaches, and novel SPM probes and spectroscopies.

Sponsored by

Discovery Park
Birck Nanotechnology Center, Purdue University
School of Biomedical Engineering, Purdue University
School of Mechanical Engineering, Purdue University
NSF NCN, Purdue University
NASA INAC, Purdue University
National Science Foundation (CMS)
Army Research Office
VEECO Instruments

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Researchers should cite this work as follows:

  • (2006), "Frontiers in Scanning Probe Microscopy," http://nanohub.org/resources/2035.

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In This Workshop

  1. SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers

    30 Nov 2006 | Online Presentations | Contributor(s): Sergei Magonov, Sergey Belikov

    High-resolution imaging of surfaces and compositional mapping of heterogeneous materials are the main functions of atomic force microscopy (AFM) in studies of polymer materials. Compositional mapping is mostly based on differences of mechanical properties of the sample components yet quantitative …

  2. SPMW Nanomechanics: from nanotechnology to biology

    12 Dec 2006 | Online Presentations | Contributor(s): Elisa Riedo

    The development of new materials with size of few nanometers has opened a new field of scientific and technological research. The goal is to develop faster and better communication systems and transports, as well as smarter and smaller nanodevices for biomedical applications. To reach these …

  3. SPMW Mechanisms of atomic friction studied by friction force microscopy

    12 Dec 2006 | Online Presentations | Contributor(s): Ernst Meyer

    Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will be shown that atomic-scale stick-slip is relatively well understood, where the dependence on velocity …

  4. SPMW Nanotube, nanoneedle and nanomeniscus: mechanical and wetting properties of modified AFM tip apex

    12 Dec 2006 | Online Presentations | Contributor(s): J. P. Aimé

    Among AFM microscopes, Dynamic force microscopes (DFM) are very sensitive to variation of minute forces involved in the interaction between the tip and the surface. However, despite numerous efforts, imaging and probing mechanical properties of soft materials in air and water at the nm scale are …

  5. SPMW The Nanomechanics of compositional mapping in amplitude modulation AFM

    05 Jan 2007 | Online Presentations | Contributor(s): Ricardo Garcia

    Amplitude modulation atomic force microscopy (AM-AFM) has been very successful for imaging with high spatial resolution inorganic as well as soft materials such as polymers, living cells and single biomolecules in their natural environment [1]. The ability of AM-AFM to separate topography from …

  6. SPMW Single molecule recognition atomic force microscopy

    05 Jan 2007 | Online Presentations | Contributor(s): Peter Hinterdorfer

    In molecular recognition force microscopy (MRFM), ligands are covalently attached to atomic force microscopy tips for the molecular recognition of their cognitive receptors on probe surfaces. A ligand-containing tip is approached towards the receptors on the probe surface, which possibly leads to …

  7. SPMW Scanning Impedance Microscopy: probing local electronic structure and transport anomalies

    05 Jan 2007 | Online Presentations | Contributor(s): Dawn Bonnell

    Multiple modulation SPM is a general term for a strategy that extracts information about a surface or nanostructure by combining various signals on samples and tips, using multiple frequencies to distinguish them and accessing multiple harmonics in detection. In addition to the usual conductance, …

  8. SPMW A fresh look to amplitude-modulation AFM: Force minimization, interaction measurement, and the quest for high resolution

    05 Jan 2007 | Online Presentations | Contributor(s): Udo D. Schwarz

    Frequency modulation atomic force microscopy (FM-AFM) has been able to deliver high-resolution atomic-scale images in ultrahigh vacuum for over one decade. In addition, there have been recent reports where atomic resolution has been achieved in air and liquids using FM-AFM [1]. Achieving molecular …

  9. SPMW Scanning Probe Acceleration Microscopy: Towards Real Time Reconstruction of Tip-Sample Forces in Tapping Mode AFM

    05 Jan 2007 | Online Presentations | Contributor(s): Tomasz Kowalewski

    Tapping mode atomic force microscopy (TMAFM) in fluids has become an increasingly important technique, especially in studying biological samples under near physiological conditions. However, until recently the physics of tapping mode operation under fluids has not been well understood. The first …

  10. SPMW FIRAT: A fast and sensitive probe structure for SPM

    05 Jan 2007 | Online Presentations | Contributor(s): F. Levent Degertekin

    A new SPM probe, called the force sensing integrated readout and active tip (FIRAT), is described and initial experimental results obtained on commercial AFM systems are presented. FIRAT combines a micromachined integrated electrostatic actuator to move the tip and an integrated optical …

  11. SPMW Nonlinear dynamics in AFM - chaos and parametric resonance

    05 Jan 2007 | Online Presentations | Contributor(s): Arvind Raman

    The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to interpret and predict probe oscillations in dynamic AFM [1] are becoming increasingly clear. Nonlinear …

  12. SPMW AFM at Video Rate and Beyond

    16 May 2007 | Online Presentations | Contributor(s): Mervyn Miles

    The particular advantages that atomic force microscopy (AFM) has over other types of microscopy are well-known, but it has the one major disadvantage of low imaging rates in conventional instruments in which each image requires typically a minute or more to collect. This has two major detrimental …

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