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X-Ray Photoelectron Spectroscopy (XPS)

By David Echevarria Torres

University of Texas at El Paso

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Abstract

The XPS (X-Ray Photoelectron Spectroscopy) it is also known as ESCA (Electron Spectroscopy for Chemical Analysis). This technique is based on the theory of the photoelectric effect that was developed by Einstein, yet it was Dr. Siegbahn and his research group who developed the XPS technique. The XPS is very useful because it is a sensitive surface technique. It gives information about the elements that compose the surface by the irradiation of X-Rays into the sample. The electrons ejected from the sample will travel through the Cylindrical Mirror Analyzer and finally, through the detector. The data will be given by a spectrum with the Binding Energies (BE) which are characteristic of each element. There are many applications for the XPS such as the analysis of polymer surface, catalyst, thin film coating and others.

Bio

David Echevarría Torres received his B.S. at the Pontifical Catholic University of Puerto Rico (PUCPR) where he was a MARC and LSAMP Scholar. He is currently a chemistry master student at The University of Texas at El Paso (UTEP). He is working with Dr.Keith Pannell in organometallic chemistry. His research consists of the synthesis of metal chelators with functional groups that will enable both chromatographic and membrane metal separations, including actinide separations. David, is one of the Louis Stokes Alliance for Minority Participation (LSAMP) scholars that is funded by the National Science Foundation at UTEP.

Sponsored by

Network for Computational Nanotechnology
Louis Stokes Alliance for Minority Participation (LSAMP)

Cite this work

Researchers should cite this work as follows:

  • David Echevarria Torres (2006), "X-Ray Photoelectron Spectroscopy (XPS)," http://nanohub.org/resources/2109.

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