[Illinois] Diffraction and Beyond: Thin Film Analysis by X-Ray Scattering with a Multipurpose Diffractometer

By Scott Speakman

PANalyitical, Inc.

Published on

Bio

Dr. Scott Speakman was previously a postdoctoral researcher jointly in the Department of Materials Science and Engineering and Oak Ridge National Laboratory (ORNL). He was in charge of the diffraction facility at MIT before joining Panalytical, and hence has extensive hands-on experience with diffraction systems.

Cite this work

Researchers should cite this work as follows:

  • Scott Speakman (2015), "[Illinois] Diffraction and Beyond: Thin Film Analysis by X-Ray Scattering with a Multipurpose Diffractometer," http://nanohub.org/resources/22632.

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Submitter

NanoBio Node, Aly Taha

University of Illinois at Urbana-Champaign

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