[Illinois] Advanced Materials Characterization Workshop 2015

By Ted Limpoco1, Scott Speakman2, Timothy P. Spila3, Rick Haasch3, Justin Masone4, Kathy Walsh3, Matthew Bresin3

1. Asylum Research and Oxford Instruments 2. PANalyitical, Inc. 3. University of Illinois at Urbana-Champaign 4. Shimadzu Scientific Instruments

Category

Workshops

Published on

Abstract

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AMC 2015 provided a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Lectures covered basic and advanced topics geared towards both novice and experienced scientists.

Sessions focused on problem solving strategies, resolution requirements and potential artifacts in data collection and analysis. Several walkthrough examples from various fields were demonstrated.

Topics

  • Atomic force microscopy (AFM).
  • Optical spectroscopy (Raman, FTIR, ellipsometry, etc.) and microscopy (confocal, near-field scanning).
  • Surface analysis: Auger electron spectroscopy, secondary ion mass spectrometry (SIMS), x-ray photoelectron spectroscopy (XPS), Rutherford backscattering (RBS).
  • Scanning and transmission electron microscopy (SEM, TEM, STEM).
  • X-ray diffraction (XRD), reflectivity (XRR), micro-XRD and small-angle x-ray scatterings (SAXS).
  • Special session on sample preparation and analysis of biological materials.

 

Bio

MRL staff scientists with 20+ years of hands-on experience in materials characterization with industrial scientists introducing new technology and metrology.

Cite this work

Researchers should cite this work as follows:

  • Ted Limpoco; Scott Speakman; Timothy P. Spila; Rick Haasch; Justin Masone; Kathy Walsh; Matthew Bresin (2015), "[Illinois] Advanced Materials Characterization Workshop 2015," http://nanohub.org/resources/22636.

    BibTex | EndNote

Time

Location

Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL

Submitter

NanoBio Node, Aly Taha

University of Illinois at Urbana-Champaign

Tags

In This Workshop

  1. [Illinois] Quantitative Elastic Measurements of High Modulus Materials with Tapping/AM-FM Mode

    18 Aug 2015 | Online Presentations | Contributor(s): Ted Limpoco

  2. [Illinois] Rutherford Backscattering Spectroscopy

    18 Aug 2015 | Online Presentations | Contributor(s): Timothy P. Spila

  3. [Illinois] Introduction to Elemental Analysis by ED-XRF

    18 Aug 2015 | Online Presentations | Contributor(s): Justin Masone

  4. [Illinois] Nano- and Micromechanics

    18 Aug 2015 | Online Presentations | Contributor(s): Kathy Walsh

  5. [Illinois] An Introduction to Scanning Electron Microscopy and Focused Ion Beam

    18 Aug 2015 | Online Presentations | Contributor(s): Matthew Bresin

  6. [Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 1

    18 Aug 2015 | Online Presentations | Contributor(s): Rick Haasch

  7. [Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 2

    18 Aug 2015 | Online Presentations | Contributor(s): Rick Haasch

  8. [Illinois] Diffraction and Beyond: Thin Film Analysis by X-Ray Scattering with a Multipurpose Diffractometer

    18 Aug 2015 | Online Presentations | Contributor(s): Scott Speakman

  9. [Illinois] Secondary Ion Mass Spectroscopy

    18 Aug 2015 | Online Presentations | Contributor(s): Timothy P. Spila