[Illinois] AMC workshop: High speed, high resolution nanoscale tomography measurements of low Z engineered materials

By Tom Mcnulty

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Abstract

Advanced Material Characterization Workshop June 7-8 2016
Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign

 

Bio

Tom McNulty, Rigaku Americas Corporation

Sponsored by

Platinum sponsors: Anasys, Asylum Research, Denton Vacuum, Keysight, PANalytical, RHK, Rigaku, Shimadzu.
Sponsors: Aerotech, Bruker-AXS, CAMECA, DMS, FEI, Hitachi, Hysitron, IXRF Systems, JEOL, K. J. Lesker,
MidWest Vacuum, Neaspec, Princeton Inst, Raith, Sensofar, Specialty Coating.

Cite this work

Researchers should cite this work as follows:

  • Tom Mcnulty (2016), "[Illinois] AMC workshop: High speed, high resolution nanoscale tomography measurements of low Z engineered materials," http://nanohub.org/resources/24392.

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