Characterization of 2D materials at Birck Surface Analysis Facility

By Dmitry Zemlyanov

Birck Nanotechnology Center, Purdue University, West Lafayette, IN

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Abstract

Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and Colleges of Science. I would like to demonstrate examples of the studies using X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy/spectroscopy (STM), high–resolution electron energy loss spectroscopy (HREELS), low energy electron diffraction (LEED). The applications of these techniques will be represented for the studies of 2D materials and thing films (graphene, phosphorene, BN, MoS2), atomic layer deposition and biologically-inspired surfaces (briefly).

Bio

Dmitry Zemlanov Dmitry Zemlyanov received his Ph.D. in Physics and Mathematics from the Novosibirsk State University, Russia, in 1995. He is currently a Senior Research Scientist - Surface Science Application at Birck Nanotechnology Center, Purdue University. He held research and teaching positions in premier scientific organizations in Russia, Ireland and Germany prior to joining Purdue and published over 115 journal papers in the areas of surface science, catalysis and materials science. At Purdue, he collaborates with a wide variety of research groups from College of Science and College of Engineering enabling them to develop and apply advanced scientific instrumentation in the area of surface characterization.

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Researchers should cite this work as follows:

  • Dmitry Zemlyanov (2016), "Characterization of 2D materials at Birck Surface Analysis Facility," http://nanohub.org/resources/25042.

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Location

1001 Wang, Purdue University, West Lafayette, IN

Tags

Characterization of 2D materials at Birck Surface Analysis Facility
  • Characterization of 2D materials at Birck Surface Analysis Facility 1. Characterization of 2D materia… 0
    00:00/00:00
  • Why Surface Science? 2. Why Surface Science? 12.579245912579246
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  • Spatial resolution of the techniques 3. Spatial resolution of the tech… 213.27994661327995
    00:00/00:00
  • Surface Characterization Facility at Birck 4. Surface Characterization Facil… 277.71104437771106
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  • Outline 5. Outline 363.46346346346348
    00:00/00:00
  • Graphene – STM 6. Graphene – STM 418.284951618285
    00:00/00:00
  • Graphene by STM 7. Graphene by STM 511.21121121121121
    00:00/00:00
  • Graphene – STM 8. Graphene – STM 667.46746746746749
    00:00/00:00
  • Graphene – XPS 9. Graphene – XPS 754.7881214547881
    00:00/00:00
  • Graphene – XPS 10. Graphene – XPS 851.88521855188526
    00:00/00:00
  • Graphene – XPS 11. Graphene – XPS 943.20987654320993
    00:00/00:00
  • Graphene – XPS 12. Graphene – XPS 1040.6740073406741
    00:00/00:00
  • MoS2/sapphire – XPS 13. MoS2/sapphire – XPS 1119.7864531197865
    00:00/00:00
  • BN/sapphire – XPS 14. BN/sapphire – XPS 1162.0620620620621
    00:00/00:00
  • BN/copper – XPS and STM 15. BN/copper – XPS and STM 1206.5398732065398
    00:00/00:00
  • 2D materials – XPS 16. 2D materials – XPS 1420.1201201201202
    00:00/00:00
  • 2D materials – STM and XPS 17. 2D materials – STM and XPS 1446.2462462462463
    00:00/00:00
  • Phosphorene degradation (black phosphorus) - XPS 18. Phosphorene degradation (black… 1496.6633299966634
    00:00/00:00
  • Phosphorene degradation (black phosphorus) - XPS 19. Phosphorene degradation (black… 1554.4878211544879
    00:00/00:00
  • Phosphorene degradation (black phosphorus) - XPS 20. Phosphorene degradation (black… 1653.0530530530532
    00:00/00:00
  • Phosphorene (black phosphorus) - STM 21. Phosphorene (black phosphorus)… 1811.9119119119121
    00:00/00:00
  • 5% O2/Ar at room temperature 22. 5% O2/Ar at room temperature 1896.4631297964631
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  • 5%O2 & 2.3%H2O in Ar Treatment 23. 5%O2 & 2.3%H2O in Ar Treatment 1928.5952619285954
    00:00/00:00
  • Phosphorene degradation (black phosphorus) - XPS 24. Phosphorene degradation (black… 1951.7183850517185
    00:00/00:00
  • 5%O2 & 2.3%H2O in Ar Treatment 25. 5%O2 & 2.3%H2O in Ar Treatment 1958.6586586586586
    00:00/00:00
  • Phosphorene degradation (black phosphorus) - XPS 26. Phosphorene degradation (black… 1986.7867867867869
    00:00/00:00
  • Depth Profiling - XPS 27. Depth Profiling - XPS 2039.2392392392394
    00:00/00:00
  • Depth Profiling - XPS 28. Depth Profiling - XPS 2112.9462796129465
    00:00/00:00
  • Depth Profiling - XPS 29. Depth Profiling - XPS 2169.0357023690358
    00:00/00:00
  • Depth Profiling - XPS 30. Depth Profiling - XPS 2197.4641307974643
    00:00/00:00
  • Li-ion battery - XPS 31. Li-ion battery - XPS 2268.6353019686353
    00:00/00:00
  • Surface Analysis Cluster 32. Surface Analysis Cluster 2362.8962295628962
    00:00/00:00
  • ALD: Examples of substrates and precursors 33. ALD: Examples of substrates an… 2398.5985985985985
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  • Acknowledgements 34. Acknowledgements 2417.7177177177177
    00:00/00:00
  • September 21, 2016 35. September 21, 2016 2456.8568568568571
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  • Thank you! Questions? 36. Thank you! Questions? 2477.1438104771437
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  • Li-ion battery - XPS 37. Li-ion battery - XPS 2674.1408074741407
    00:00/00:00
  • Thank you! Questions? 38. Thank you! Questions? 2746.2128795462131
    00:00/00:00