BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

Published on

Cite this work

Researchers should cite this work as follows:

  • Ron Reifenberger (2007), "BNC Annual Research Symposium: Metrology and Nanomaterials Characterization," http://nanohub.org/resources/2635.

    BibTex | EndNote

Time

Location

Burton Morgan Building, Room 121

Tags

  1. atomic force microscopy
  2. materials science
  3. X-Ray Photoelectron Spectroscopy
  4. electron microscopy
  5. experiments
  6. scanning probe microscopy
  7. nanotribology