Statistical Process Control (SPC) Learning Module

By Southwest Center for Microsystems Education (SCME)

Southwest Center for Microsystems Education, University of New Mexico, Albuquerque, NM

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Abstract

Statistical Process Control (SPC) is a set of tools used for continuous improvement and the assurance of quality in an active manufacturing process.  This learning module introduces some of the SPC tools used by technicians and engineers, including one of the most common tools - control charts.  Activities provide the opportunity to demonstrate an understanding of control charts using select data sets.

The SPC Learning Modules contains the following.

  • Pre-test (Knowledge Proble)
  • Reading:  Introduction to Statistical Process Control
  • Presentation:  Introduction to Statistical Process Control (pptx with notes)
  • Reading:  Control Chart Basics
  • Presentation:  Control Chart Basics (pptx with notes)
  • Activity:  Apply SPC to Resistance Measurements
  • Activity (Advanced):  MEMS Process Problem*
  • Assessment:  Multiple choice
  • Assessment:  Short Answer

*This activity can be found in the SCME "A Systemic Approach to Problem Solving Learning Module".

Instructor materials for this learning module are available here.

Sponsored by

This work made possible by Southwest Center for Microsystems Education (SCME), a National Science Foundation (NSF) funded Center through DUE grants #0830384, 0902411, and 1205138. Any opinions, findings and conclusions or recommendations expressed in this material are those of the authors and creators, and do not necessarily reflect the views of the NSF. 

Cite this work

Researchers should cite this work as follows:

  • Southwest Center for Microsystems Education (SCME) (2017), "Statistical Process Control (SPC) Learning Module," http://nanohub.org/resources/26813.

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Submitter

MJ Willis

Southwest Center for Microsystems Education, University of New Mexico, Albuquerque, NM

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