NACK Unit 6: Basic Characterization Techniques

By NACK Network

Center for Nanotechnology Education and Utilization, Pennsylvania State University, State College, PA

Category

Courses

Published on

Cite this work

Researchers should cite this work as follows:

  • NACK Network (2018), "NACK Unit 6: Basic Characterization Techniques," http://nanohub.org/resources/27532.

    BibTex | EndNote

NACK Network

NACK Network group image

Lecture Number/Topic Online Lecture Video Lecture Notes Supplemental Material Suggested Exercises
Touching, Seeing, Chemically Detecting, and Hearing at our Size Scale View HTML
View Notes (pdf) Notes (pptx)
The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale View HTML
View Notes (pdf) Notes (pptx)
Electron Microscopy View HTML
View Notes (pdf) Notes (pptx)
Basic Characterization Techniques View HTML
View Notes (pdf) Notes (pptx)
X-Ray Photoelectron Spectroscopy (XPS) View HTML
View Notes (pdf) Notes (pptx)
Advanced Scanning Probe Microscopy I View HTML
View Notes (pdf)
Advanced Scanning Probe Microscopy II View HTML
View Notes (pdf)
Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nano-Scale View HTML
View Notes (pdf) Notes (pptx)
Introduction to Scanning Electron Microscopy (SEM) View
Introduction to Field Emission Scanning Electron Microscopy (FESEM) View
Operational Overview of the Veeco Innova Scanning Probe Microscope (SPM) View